Micro Spectrophotometer
A reflectprovides highly accurate spectral reflecivity measurements of small, curved, and thin samples without interference from rear surface-reflected light.
Main Application/Advantages:
The curved surface of the lens can be measured from a minute spot as small as ø60 µm formed on the sample surface.
Reduces backside interference and no need of anti-reflection treatments.
Quick, highly Repeatable measurements can be achieved in second.
Specification:
Items | Description |
| Measurement wavelength | 380nm - 780nm |
| Measurement repeatability (2 ) | ±0.1 % and less (during 380 nm - 410 nm measurement) ±0.01 % and less (during 410 nm - 700 nm measurement) |
| Sample N.A.* | 0.12 (using 10x objective lens) 0.24 (using 20x objective lens) * it differs from objective lens' N.A. |
