Scanning Electron Microscopy (SEM)
Surface Morphology, Contamination, Grain Size and Coating Thickness
Specializing in detailed failure analysis, our expertise encompasses surface morphology, fracture studies, coating thickness, cross-sectional analysis, defects/contamination scrutiny.
Specifications
Magnification:
25x ~ 1,000,000x
Accelerating Voltage:
0.1 ~ 30kV
Resolution:
3.0 ~ 4.5nm
Surface Morphology
Contamination
Thickness of coating
Cross Sectional
Grain size
3D Optical Profiler
Profile and Roughness Measurement
Expertise in non-contact sample surface roughness measurement and precise depth/step height profiling for comprehensive failure analysis and quality assurance.
Specifications
Max Scan Range:
AUp to 10mm
Sample Height:
Up to 100mm (4in.)
Objectives:
5x, 20x
Digital Microscope
3D Profile Measurement
Analysis with detailed surface observation and precise 2D and 3D measurements.
Specifications
Magnification:
20x ~ 2000x
Camera Resolution:
1600(H) X 1200(V)
