Thin Film Analysis
Universal Micro Materials Tester
A universal micro material tester can be used for the determination of scratch, adhesion and wear performance, as well as show the 3D surface profile of a material. The tester works on the principle of a sensor between force and voice CoF = F(x)/F(z).
Main Application/Advantages
This machine can test many kinds of material, such as semiconductor wafers, metals, ceramics, hard coatings, and thin film coatings. An example of its application is adhesion testing for TiC coating on SS.
Specifications
Diamond Stylus:
2 ~ 200um
Patented Micro-blades:
0.4 ~ 1.0mm
Range of Normal Load:
0.1 ~ 100N
Step Height Repeatability:
0.8um
Scan Range:
300um x 300um
Measurement Height Fine Range:
10um
Stylus Tip Loading Force:
0.1 ~ 100mg
UV-Visible Spectrophotometer
Main Application/Advantages
Designed in accordance with the governing European and Japanese Pharmacopoeia.
Achieves a resolution of 1 nm.
Easily satisfies the standards of wavelength resolution demanded by the European Pharmacopoeia.
Specifications
Measurement Wavelength Range:
190 to 1,100nm
Spectral Bandwidth:
1nm (190 to 1,100nm)
Wavelength Setting:
0.1nm increments (1nm increments when setting scanning range)
Wavelength Accuracy:
±0.05nm at D2 peak 656.1nm,
±0.3nm for entire range
Wavelength Repeatability:
±0.025nm
Wavelength Slew Rate:
Approx. 29,000 nm/min
Wavelength Scanning Speed:
3,000 to 2 nm/min
29,000 nm/min when survery scanning